The main aim of this congress is to provide a scientific forum to present and promote the use of analytical techniques in the field of cultural heritage. The conference builds on the momentum of the previous TECHNART editions of Lisbon (2007), Athens (2009), Berlin (2011), Amsterdam (2013), Catania (2015) and Bilbao (2017).
The meeting offers an outstanding opportunity for exchanging knowledge and experience on leading edge developments in cultural heritage analysis. This includes studies on pigments, lithic materials, metals, glass, ceramics, resins and fibres and also chemometrics, forensic applications, art history, archaeology and conservation science.
The 2019 edition is organized by Koen Janssens (University of Antwerp), Till-Holger Borchert (Musea Brugge), Geert Van der Snickt (University of Antwerp), Vanessa Paumen (Flemish research centre for the arts in the Burgundian Netherlands, Musea Brugge), Luc Van’t dack (University of Antwerp), Anne van Oosterwijk (Musea Brugge), Guenevere Souffreau (Musea Brugge), David Strivay (Liege University), and Peter Vandenabeele (Ghent University).
The organizers welcome oral and poster contributions on subjects within the scope of the conference. Each attending author can submit several contributions but only one as an oral presentation. Deadline for applications: 28 January 2019
Conference topics:
- X-ray analysis (XRF, PIXE, XRD, SEM-EDX)
- Confocal X-ray microscopy (3D ”-XRF, 3D ”-PIXE)
- Synchrotron, ion beam and neutron based techniques/instrumentation
- FT-IR and Raman spectroscopy and microscopy
- UV-Vis and NIR absorption/reflectance and fluorescence
- Laser-based analytical methods (LIBSÂ etc.)
- Magnetic resonance techniques
- Chromatography (GC, HPLC) and mass spectrometry
- Optical and coherent imaging techniques
- Mobile spectrometry and spectroscopy
- Remote sensing and hyperspectral imaging
- Case studies employing one or more analytical methods
Consult the conference website for more information.